AlScN-Coated Sapphire

Aluminum Scandium Nitride (AlScN) Film on Sapphire Wafer Template Application: Designed as the premier core substrate material for next-generation 5G RF SAW/BAW filters and MEMS sensors. The C-axis sound velocity of AlN thin films can reach 12,000 m/s (compared to <4,000 m/s for traditional substrates), making it ideal for high-frequency applications. Product Overview: This product…