30-Degree Internally Threaded SEM Specimen Stub, 25 mm
Specimen Stubs

30-Degree Internally Threaded SEM Specimen Stub, 25 mm

SKU: MIC-Stub-287

US$21.63

Minimum order quantity: 7 (subtotal US$151.41).

Dispatch normally within 1 business day; carrier transit normally 6–8 business days (7–9 business days in total). See Shipping Policy and Returns Policy.

For research and laboratory use only. Not for medical, diagnostic or household use.

SEM specimen stub with a 30-degree cross-section face and an internal thread, 25 mm in diameter and 10 mm high. The stub is lightly polished and may show small machining marks that do not affect use. Dimensions are measured by hand and may vary slightly. Supplied as one stub.

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