GYSGG (Gd₀.₆₃Y₂.₃₇Sc₂Ga₅O₁₂) Single Crystal Wafers

GYSGG (Gd₀.₆₃Y₂.₃₇Sc₂Ga₃O₁₂) Single Crystal Wafers

Physical Properties:
– Crystal Structure: Cubic System
– Lattice Constant: 12.507 Angstrom
– 2 theta: 50°40′
– Melting Point: 1877 °C
– Density: 5.6 g/cm³
– Mohs Hardness: 7 (Mohs)
– Refractive Index: 1.97
– Growth Method: CZ

Standard Specifications:
– Orientation:
(100) miscut < 0.3° (Available <0.1°)
(110) miscut < 0.3° (Available <0.1°)
(111) miscut < 0.3° (Available <0.1°)
– Edge orientation: Available
– Dimensions: dia 2 inch x 0.5 mm (Only for 111 orientation products)
– Surface Finish: Single-Side Polished / Double-Side Polished
– Surface Roughness: Ra: < 0.5 nm