Silicon-Topped Specimen Stub
zł115.98
Minimum order quantity: 5 (subtotal zł579.90).
Dispatch normally within 1 business day; carrier transit normally 6–8 business days (7–9 business days in total). See Shipping Policy and Returns Policy.
For research and laboratory use only. Not for medical, diagnostic or household use.
DZ16111-9S silicon-topped SEM specimen stub, 12.7 mm in diameter and 9 mm high. The silicon top provides a flat, smooth, clean surface, which is useful for dispersing nanoparticles, powders, thin films and 2D materials for SEM imaging. It saves cutting and mounting wafer pieces yourself. Check that a 12.7 mm pin-type stub fits your SEM holder before ordering. Sold per piece.






