Custom silicon nitride (Si₃N₄) windows are ideal carriers for structural analysis and transmission imaging in synchrotron X-ray, soft X-ray, UV, and extreme UV applications. These thin-film windows provide exceptional thermal stability, enabling quasi-in-situ studies of sample morphology before and after annealing processes.
Applications and Benefits:
Versatile Sample Support: Suitable for TEM observation of materials and biological specimens, silicon nitride windows offer a high-contrast, non-toxic substrate ideal for biological sample culture and imaging.
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Enhanced Analysis for Carbon-Based Samples: Silicon nitride windows minimize interference, making them excellent for EDX/EELS analysis of carbon-containing samples.
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